X-TechLab

Training axes

The X-TechLab training has two annual sessions. In two fields: “Crystallography and X-ray diffraction techniques” and “Tomography and Mathematical Engineering”.

SESSION I : May 13 to 24, 2019
SESSION II : November 18 to 30, 2019

X-TechLab Training
Crystallography and X-ray techniques

 11.18.2019 – 11.28.2019

  • Crystal Symmetry: point group, space group
  • Understanding International Tables for Crystallography
  • Tutorials on Cambridge Structural Data base (CSD)
  • Crystal growth techniques: basic of growth mechanisms and solidification, nucleation processes, kinetic processes, phase diagrams and principles of segregation, overview on Main growth techniques
  • Crystal defects & twins
  • Reminder about the intensity from a small crystal, powder samples, texture, microstrains
  • Indexing of a powder diffraction pattern, quantitative analysis
  • Samples preparation, measurements of diffraction patterns
  • Rietveld refinement: theory & practice
  • Instrument resolution, phase identification, crystallite size
  • Tutorial on ICDD data bases (XRD, PDF-4)
  • X-Ray acquisition methods: XANES, EXAFS, XES, XPS, X-Ray Imaging focus on tomography
  • Workshop in Project Management.
X-TechLab Formations
Tomography and mathematical engineering

 11.18.2019 – 11.28.2019

  • Image correlation methods: overview on the techniques, Digital Image Correlation method (DIC), metrology, kinematics of deformable media
  • Mechanical tests and measurements on a granular media
  • Mathematical morphology: Introduction, morphological measurements, introduction to random closed sets and to random functions, basic morphological models of random sets and of random functions.
  • Characterization and thermal analysis: heat conduction, Transfer & Thermal rays, thermal properties measurements, pyrometry & Non Destructive Test, sustainable Construction, numerical modeling (COMSOL, FLUENT, PYTHON, etc.).
  • Basic concept of X-ray, Synchrotron and Free Electron Lasers, relevant techniques, interaction of X-ray with matter, diffraction and scattering, X-ray spectroscopy, Imaging techniques
  • Workshop on project development and management.

X-rays techniques training

X-TechLab will train one hundred (100) technicians, engineers and researchers each year in two experimental characterization techniques: diffraction and X microtomography.

DIFFRACTION
Crystallography and X- ray techniques
Areas for structural studies applied to different issues of interest in life sciences, agriculture, environment and energy.
MICROTOMOGRAPHY X
Tomography and mathematical engineering
Development and implementation of a methodology for the development of innovative, ecological materials adapted to the local environment. This methodology implements a chain comprising the acquisition of 2D images allowing the 3D reconstruction of the interior of the samples, the extraction of morphological data using mathematical methods and numerical calculations.
APPLICATION
Conditions of eligibility for the program
An international call for applications will be launched before each training session. Applications will be made online directly on our platform.
SELECTION
The selection criteria are as follows:
- Quality of the file
- Degree of motivation
- Relevance of the research project

Mathematical engineering at the service of sustainable development

Microtomography covers a very broad spectrum of applications in the field of materials science. As part of the X-TechLab training, we will focus in particular on the unique potential of this technique for the development of a sustainable, ecological and comfortable habitat. The current model in Africa relies almost exclusively on the systematic use of concrete, being far from offering optimal performance.

The design and optimization of a new generation of materials from local ingredients for a comfortable and environmentally friendly habitat requires the mastery and implementation of specific theoretical and experimental tools. In addition to conventional thermomechanical tests, our approach is to couple data from nondestructive investigative means (X-ray imaging, spectroscopy) to the use of mathematical algorithms to extract material characteristics.

All of these innovative tools and methodologies will be one of the major achievements in the training for participants wishing to invest in materials engineering applications.

Our lecturers

Crystallography and technical diffraction X

José Manuel MERINO ALVAREZ, Professor, University of Madrid, Espagne, josem.merino@uam.es

Eberhardt Josué FRIEDRICH KERNAHAN, PhD, University of Madrid, Espagne, josue.friedrich@uam.es

Thomas BLANTON, PhD, Executive Director, International Centre for Diffraction Data, tblanton@icdd.com

Philip Oladijo, Professor, Botswana International University of Science and Technology, Botswana, oladijop@biust.ac.bw

Michele ZEMA, PhD, University of Pavia, Italie, IUCr Executive Outreach Officer, michele.zema@unipv.it

Suzanna WARD, Head of the Cambridge Structural Database, Cambridge Crystallographic Data Centre, ward@ccdc.cam.ac.uk

Thierry d’ALMEIDA, Research Director, Commissariat à l’Energie Atomique et aux Energies Alternatives (CEA), France, Thierry.DALMEIDA@cea.fr

Etienne SAGBO, PhD, Université d’Abomey-Calavi, esagbo@yahoo.fr

Marielle AGBAHOUNGBATA, PhD, X-TechLab Coordinator, Agence de Développement de Sèmè City, m.agbahoungbata@xtechlab.co

Tomography and Mathematical Engineering

François Hild Professor, Ecole Normale Supérieure-Cachan, France, hild@lmt.ens-cachan.fr

Dominique JEULINEmeritus Professor, Mines-Paris Tech, France, dominique.jeulin@mines-paristech.fr

Alain FANGET, Research Scientist, Commissariat à l’Energie Atomique et aux Energies Alternatives (CEA), France, fanget@wanadoo.fr

Thierry DUVAUT, Professor, Université de Reims Champagne Ardenne, France, duvaut@univ-reims.fr

Thierry d’ALMEIDA, Research Director, Commissariat à l’Energie Atomique et aux Energies Alternatives (CEA), France, Thierry.DALMEIDA@cea.fr